首页> 美国政府科技报告 >Equipment for In-Situ Studies of Metal on III-V Semiconductors
【24h】

Equipment for In-Situ Studies of Metal on III-V Semiconductors

机译:III-V半导体金属原位研究设备

获取原文

摘要

This supplemental grant was used to purchase a badly needed workstation formodeling of quantitative electron diffraction patterns from surfaces. The equipment purchased was an Hewlett-Packard 715/75 workstation. For reasons which are not completely clear, this computer ended up costing $58.78 less than the quote from Hewlett-Packard upon which the proposed budget was based. In addition to providing additional computing power for calculating diffraction patterns from surfaces, it also opened up completely new areas. Perhaps the most exciting of these is compute intensive image filtering based around Wiener filters 4-5 which have allowed us to directly resolve atomic surface structures at a resolution of better than 0.25 nm 1,3,6. We have also used these new filter methods of image restorations in a very large number of cases for work both directly supported by AFOSR and by other agencies. It is realistic to state that with these filters we have almost completely abandoned dark-room chemical printing for digital processing images, at a substantial long-term reduction in costs. jg p.3.

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号