Microwave intermodulation distortion measurements in unpatterned and patterned YBCO thin films

摘要

We present the work on intermodulation distortion (IMD) in the tinpatterned and patterned states of 1 cm(2) YBCO films, employing dielectric resonator and coplanar resonator techniques, respectively. The unpatterned films are measured using rutile and sapphire dielectric resonators. Subsequently. these films are patterned into identical coplanar resonator structures. Third order IMD products vs. input power for all the films studied typically show a noticeable deviation from the conventional 3:1 scaling towards a lower slope. Third order intercept powers for unpatterned and patterned states of the films appear to be slightly different and also temperature dependent. (C) 2002 Elsevier Science B.V. All rights reserved. [References: 5]