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首页> 外文期刊>Physica, C. Superconductivity and its applications >Accurate numerical calculation of shielding current density in HTS thin film: application to noncontact measurement method of critical current density
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Accurate numerical calculation of shielding current density in HTS thin film: application to noncontact measurement method of critical current density

机译:HTS薄膜中屏蔽电流密度的精确数值计算:在临界电流密度的非接触式测量方法中的应用

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摘要

The numerical method has been developed for calculating the shielding current density in a high temperature superconducting thin film. After formulated by use of the current-vector-potential method, the behavior of the shielding current density is expressed as an integral-differential equation. When the initial-boundary-value problem of the equation is discretized with respect to time and space, improper integrals appear as coefficients of the nonlinear system. In order to evaluate the coefficients accurately, the double exponential formula is applied to the improper integrals. Consequently, the shielding current density can be determined accurately. As an application of the method, two types of the noncontact methods for measuring the critical current density j(C) have been simulated numerically. The results of computations show that the maximum repulsive force is roughly proportional to j(C) in the permanent magnet method. In addition, it is found that an error of the inductive method is not more than 3% if j(C) exceeds a certain lower limit. (C) 2007 Elsevier B.V. All rights reserved.
机译:已经开发出用于计算高温超导薄膜中的屏蔽电流密度的数值方法。在使用电流矢量势方法进行公式化之后,屏蔽电流密度的行为表示为积分微分方程。当关于时间和空间离散方程的初边值问题时,不合适的积分会作为非线性系统的系数出现。为了准确评估系数,将双指数公式应用于不正确的积分。因此,可以准确地确定屏蔽电流密度。作为该方法的一种应用,已对两种用于测量临界电流密度j(C)的非接触方法进行了数值模拟。计算结果表明,在永磁方法中,最大排斥力大致与j(C)成正比。另外,发现如果j(C)超过某个下限,则归纳法的误差不超过3%。 (C)2007 Elsevier B.V.保留所有权利。

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