The structure and composition of mixed cationic and non-ionic surfactant layers adsorbed at the hydrophilic silicon surface

摘要

The use of specular neutron reflection to determine the structure and composition of mixed surfactant layers adsorbed at the liquid-solid interface is described. The structure of the bilayer formed at the hydrophilic silicon-aqueous solution interface by the mixed cationicon-ionic surfactant mixture of hexadecyltrimethyl ammonium bromide, C(16)TAB, and hexaethylene glycol monododecyl ether, C12E6, is described. The role of measurements using different isotopic (hydrogen/deuterium) labelling of the surfactant and solvent is highlighted, and the need to accurately characterise the native oxide layer on the surface of the silicon is discussed. (C) 1998 Elsevier Science B.V. All rights reserved. [References: 27]