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Experimental determination of the effective point of measurement for various detectors used in photon and electron beam dosimetry.

机译:实验确定了光子和电子束剂量测定中使用的各种检测器的有效测量点。

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The subject of this study is the 'shift of the effective point of measurement', Deltaz, well known as a method of correction compensating for the 'displacement effect' in photon and electron beam dosimetry. Radiochromic EBT 1 films have been used to measure the 'true' TPR curves of 6 and 15 MV photons and 6 and 9 MeV electrons in the solid water-equivalent material RW3. For the Roos and Markus chambers, the cylindrical 'PinPoint', 'Semiflex' and 'Rigid-Stem' chambers, the 2D-Array and the E-type silicon diode (all from PTW-Freiburg), the positions of the effective points of measurement have been determined by direct or indirect comparison between their TPR curves and those of the EBT 1 film. Both for the Roos and Markus chambers, we found Deltaz = (0.4 +/- 0.1) mm, which confirms earlier experimental and Monte Carlo results, but means a shortcoming of the 'water-equivalent window thickness' formula. For the cylindrical chambers, the ratio Deltaz/r was observed to increase with r, confirming a recent Monte Carlo prediction by Tessier (2010 E2-CN-182, Paper no 147, IDOS, Vienna) as well as the experimental observations by Johansson et al (1978 IAEA Symp. Proc. (Vienna) IAEA-SM-222/35 pp 243-70). According to a theoretical consideration, the shift of the effective point of measurement from the reference point of the detector is caused by a gradient of the fluence of the ionizing particles. As the experiments have shown, the value of Deltaz depends on the construction of the detector, but remains invariant under changes of radiation quality and depth. Other disturbances, which do not belong to the class of 'gradient effects', are not corrected by shifting the effective point of measurement.
机译:这项研究的主题是“有效测量点的偏移”,Deltaz,众所周知是一种校正方法,可以补偿光子和电子束剂量法中的“位移效应”。辐射致变色EBT 1膜已用于测量固体等效水材料RW3中6和15 MV光子以及6和9 MeV电子的“真实” TPR曲线。对于Roos和Markus腔室,圆柱形的“ PinPoint”,“ Semiflex”和“ Rigid-Stem”腔室,2D阵列和E型硅二极管(均来自PTW-Freiburg),有效点的位置通过直接或间接比较它们的TPR曲线和EBT 1膜的TPR曲线来确定测量值。对于Roos和Markus腔室,我们都发现Deltaz =(0.4 +/- 0.1)mm,这证实了较早的实验结果和Monte Carlo结果,但意味着“水当量窗口厚度”公式存在缺陷。对于圆柱室,观察到比率Deltaz / r随r增加,这证实了Tessier(2010 E2-CN-182,论文编号147,IDOS,维也纳)最近进行的蒙特卡洛预测以及Johansson等人的实验观察等(1978 IAEA Symp.Proc。(维也纳)IAEA-SM-222 / 35第243-70页)。根据理论上的考虑,有效测量点相对于检测器参考点的偏移是由电离粒子的注量梯度造成的。如实验所示,Deltaz的值取决于检测器的结构,但在辐射质量和深度的变化下仍保持不变。不属于“梯度效应”类别的其他干扰无法通过移动有效测量点来纠正。

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