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首页> 外文期刊>PACE: Pacing and clinical electrophysiology >Impact of dual chamber pacing on the incidence of atrial and ventricular tachyarrhythmias in recipients of implantable cardioverter defibrillators.
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Impact of dual chamber pacing on the incidence of atrial and ventricular tachyarrhythmias in recipients of implantable cardioverter defibrillators.

机译:双腔起搏对植入式心脏复律除颤器接受者心房和室性心律失常发生率的影响。

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Recent observations suggest that frequent dual-chamber pacing in recipients of implantable cardioverter defibrillators (ICD) may adversely influence clinical outcomes. This prospective, multicenter study examined the relationship between the frequency of atrial (%AP) and ventricular pacing (%VP) and the incidence of atrial (AT) and/or ventricular tachyarrhythmias (VT) in a standard ICD population. A total of 141 consecutive patients with primary and secondary ICD indications were studied. Continuous arrhythmia detection with a dual-chamber ICD revealed paroxysmal AT in 60 (43%) and VT in 72 (51%) patients within 6 months of device implantation. Far-field oversensing of ventricular signals occurred in 13% of all "atrial tachy response" mode switches. Without adjustment for covariates, a higher %AP was associated with an increased incidence of AT (P < 0.05). However, this association remained only weakly significant after adjustment for covariates using a multivariate model. High New York heart failure functional classes correlated significantly with AT (P = 0.02) and VT (P = 0.007). Rate-modulated pacing, programmed in 1/3 of patients, correlated with occurrence of AT (P = 0.006), but not with occurrence of VT. With respect to dual-chamber pacing, a %AP >/= 48% combined with a %VP > 40% was associated with an increased probability for VT. In conclusion, AT and VT occurred frequently within 6 months after dual-chamber ICD implantation. High rates of DDD/R stimulation were associated with a trend toward higher incidence of AT, VT, or both.
机译:最近的观察表明,植入式心脏复律除颤器(ICD)接受者频繁进行双腔起搏可能会对临床结果产生不利影响。这项前瞻性,多中心研究检查了标准ICD人群中心房频率(%AP)和心室起搏(%VP)与心房(AT)和/或室性快速性心律失常(VT)发生率之间的关系。总共研究了141位连续的具有主要和继发性ICD适应症的患者。使用双腔室ICD进行的连续心律失常检测显示,在植入装置后的6个月内,阵发性AT发生在60例(43%),VT发生在72例(51%)。在所有“房速响应”模式开关中,有13%发生了心室信号的远场过度感应。如果不对协变量进行调整,则较高的%AP与AT发生率增加相关(P <0.05)。但是,在使用多变量模型调整协变量后,这种关联仍然仅具有微弱的意义。高纽约心力衰竭功能类别与AT(P = 0.02)和VT(P = 0.007)显着相关。在1/3的患者中编程的速率调节起搏与AT的发生相关(P = 0.006),但与VT的发生无关。对于双腔起搏,%AP> / = 48%结合%VP> 40%与增加的VT机率相关。总之,AT和VT在双腔ICD植入后6个月内频繁发生。较高的DDD / R刺激率与AT,VT或两者同时发生的趋势相关。

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