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An all-field-range description of the critical current density in superconducting YBCO films

机译:全场范围描述YBCO超导薄膜中的临界电流密度

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摘要

A new critical current density (J_c) model for high-quality YBCO (YBa_2Cu_3O_7) thin films has been proposed, combining thermally activated flux creep with a vortex pinning potential for columnar defects. The pinning for thermally activated vortices has been described as strong pinning on chains of individual edge dislocations that form low-angle domain boundaries in high-quality YBCO thin films. The model yields an adequate description of the J_c behaviour over the whole applied field range, as verified by direct measurements of J_c in YBCO thin films grown by pulsed-laser deposition. It also indicates that the effective pinning landscape changes under the influence of the external conditions. Remarkably, the pinning potential obtained from the model is consistent with the values obtained for columnar defects, which confirms the validity of the overall approach.
机译:提出了一种新的用于高品质YBCO(YBa_2Cu_3O_7)薄膜的临界电流密度(J_c)模型,该模型将热活化的通量蠕变与涡旋钉扎电位相结合,以解决圆柱状缺陷。热活化涡流的钉扎已被描述为在高质量YBCO薄膜中形成低角度畴边界的单个边缘位错的链上的强钉扎。通过直接测量通过脉冲激光沉积法生长的YBCO薄膜中的J_c,验证了该模型对J_c在整个应用电场范围内的行为的充分描述。这也表明有效的钉扎景观在外部条件的影响下发生了变化。值得注意的是,从模型获得的钉扎电势与从圆柱状缺陷获得的值一致,这证实了整体方法的有效性。

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