首页> 外文期刊>Spectrochimica Acta, Part B. Atomic Spectroscopy >Quenching of the OH and nitrogen molecular emission by methane addition in an Ar capacitively coupled plasma to remove spectral interference in lead determination by atomic fluorescence spectrometry
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Quenching of the OH and nitrogen molecular emission by methane addition in an Ar capacitively coupled plasma to remove spectral interference in lead determination by atomic fluorescence spectrometry

机译:通过在Ar电容耦合等离子体中添加甲烷来淬灭OH和N分子发射,以消除原子荧光光谱法测定铅中的光谱干扰

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摘要

A new method is proposed to remove the spectral interference on elements in atomic fluorescence spectrometry by quenching of the molecular emission of the OH radical (A~2Σ~+→X~2Π) and N2 second positive system (C~3Π_u →B~Σ_g) in the background spectrum of medium power Ar plasmas. The experiments were carried out in a radiofrequency capacitively coupled plasma (275 W, 27.12 MHz) by CH4 addition. The quenching is the result of the high affinity of OH radical for a hydrogen atom from the CH4 molecule and the collisions of the second kind between nitrogen excited molecules and CH4, respectively. The decrease of the emission of N2 second positive system in the presence of CH4 is also the result of the deactivation of the metastable argon atoms that could excite the nitrogen molecules. For flow rates of 0.71 min~(-1) Ar with addition of 7.5 ml min~(-1) CH4, the molecular emission of OH and N2 was completely removed from the plasma jet spectrum at viewing heights above 60 mm. The molecular emission associated to CH and CH2 species was not observed in the emission spectrum of Ar/CH4 plasma in the ultraviolet range. The method was experimented for the determination of Pb at 283.31 nm by atomic fluorescence spectrometry with electrodeless discharge lamp and a multichannel microspectrometer. The detection limit was 35 ng ml~(-1), 2-3 times better than in atomic emission spectrometry using the same plasma source, and similar to that in hollow cathode lamp microwave plasma torch atomic fluorescence spectrometry.
机译:提出了一种新的方法,通过淬灭OH自由基(A〜2Σ〜+→X〜2Π)和N2第二正系统(C〜3Π_u→B〜Σ_g)的分子发射来消除原子荧光光谱法中元素的光谱干扰。 )在中等功率Ar等离子体的背景光谱中。通过添加CH4在射频电容耦合等离子体(275 W,27.12 MHz)中进行实验。淬灭是OH自由基对来自CH4分子的氢原子的高亲和力以及第二类氮激发分子与CH4发生碰撞的结果。在存在CH4的情况下,N2第二正系统排放的减少也是亚稳氩原子失活的结果,该氩原子可能会激发氮分子。对于流量为0.71 min〜(-1)Ar的气体,添加7.5 ml min〜(-1)CH4的情况,在60 mm以上的观察高度处,从等离子流光谱中完全去除了OH和N2的分子发射。在紫外范围内的Ar / CH4等离子体的发射光谱中未观察到与CH和CH2物种相关的分子发射。用无电极放电灯和多通道显微光谱仪通过原子荧光光谱法测定了283.31 nm处的Pb。检出限为35 ng ml〜(-1),比使用相同等离子源的原子发射光谱法高2-3倍,与中空阴极灯微波等离子炬原子荧光光谱法相似。

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