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FABRICATION OF PROTON CONDUCTING THIN FILMS OF SRZRO3 AND SRCEO3 AND THEIR FUNDAMENTAL CHARACTERIZATION

机译:SRZRO3和SRCEO3的质子传导薄膜的制备及其基本特性

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摘要

Proton conducting thin films of SrZrO3 and SrCeO3 were fabricated by the pulsed laser ablation method using ArF excimer laser. The thin films of SrCeO3 and SrZrO3 were grown in the [100] direction on the SrTiO3(100) substrate and in the [211] direction on the MgO(100) substrate and on the Al2O3 substrate. The Raman scattering spectra show that the thin films grown in the low P-o2 contain lots of oxygen ion vacancies compared to bulk crystals. [References: 7]
机译:通过使用ArF准分子激光器的脉冲激光烧蚀方法制造了SrZrO3和SrCeO3的质子传导薄膜。 SrCeO3和SrZrO3薄膜在SrTiO3(100)衬底上沿[100]方向生长,在MgO(100)衬底和Al2O3衬底上沿[211]方向生长。拉曼散射光谱表明,与块状晶体相比,在低P-o2中生长的薄膜包含许多氧离子空位。 [参考:7]

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