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首页> 外文期刊>SID International Symposium: Digest of Technology Papers >Low Temperature Furnace Method to Deposit Transparent Indium Oxide Film on Gallium Nitride-Based LED
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Low Temperature Furnace Method to Deposit Transparent Indium Oxide Film on Gallium Nitride-Based LED

机译:低温炉法在氮化镓基LED上沉积透明的氧化铟膜

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摘要

Increasing the light extraction and the current spreading area of GaN LEDs is helpful for enhancing the efficiency of the light emission. We have developed a simple deposited method of Indium oxide (In{sub}xO{sub}y) on the top layer of GaN LEDs by using furnaces at the low temperature (550℃). The deposited Film of Indium oxide on GaN LEDs is crystallites. The electroluminescent intensity of GaN LEDs with Indium oxide is higher than GaN LEDs without Indium oxide about six times.
机译:GaN LED的光提取和电流扩散面积的增加有助于提高发光效率。我们已经开发了一种在低温(550℃)下使用熔炉在GaN LED顶层上沉积氧化铟(In {sub} xO {sub} y)的简单方法。 GaN LED上的氧化铟沉积膜是微晶。具有氧化铟的GaN LED的电致发光强度比不具有氧化铟的GaN LED的电致发光强度高大约六倍。

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