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A Simple Panel Unit-Root Test with Smooth Breaks in the Presence of a Multifactor Error Structure

机译:在存在多因素误差结构的情况下具有平滑断裂的简单面板单位根检验

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摘要

This paper extends the cross-sectionally augmented panel unit-root test (CIPS) developed by Pesaran etal. (2013, Journal of Econometrics, Vol. 175, pp. 94-115) to allow for smoothing structural changes in deterministic terms modelled by a Fourier function. The proposed statistic is called the break augmented CIPS (BCIPS) statistic. We show that the non-standard limiting distribution of the (truncated) BCIPS statistic exists and tabulate its critical values. Monte-Carlo experiments point out that the sizes and powers of the BCIPS statistic are generally satisfactory as long as the number of time periods, T, is not less than fifty. The BCIPS test is then applied to examine the validity of long-run purchasing power parity.
机译:本文扩展了Pesaran等人开发的截面增强面板单位根检验(CIPS)。 (2013年,《计量经济学杂志》,第175卷,第94-115页),以使通过傅立叶函数建模的确定性术语的结构变化变得平滑。提议的统计信息称为中断增强CIPS(BCIPS)统计信息。我们显示了(截断的)BCIPS统计数据的非标准限制分布,并列出了其临界值。蒙特卡洛实验指出,只要时间段T不少于五十,BCIPS统计量的大小和功效通常是令人满意的。然后,将BCIPS测试应用于检验长期购买力平价的有效性。

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