Size Effects in the Internal Reflection in Gold Cluster Films in Polarization Modulation Experiments

摘要

The internal reflection in gold nanocluster films in the Kretschmann geometry is studied using polarization modulation of electromagnetic radiation. The reflection coefficients R_(s) and R_(p) for s- and p-polarized light, respectively, as well as their difference (DELTA)R velence R_(s) - R_(p), are measured as functions of the angle of incidence of electromagnetic radiation at different wavelengths in the range of 0.6-1.6 (mu)m. A topological size effect is found in the interaction of light with the cluster electronic system, which consists of the fact that the surface plasmon resonance in gold cluster films can be excited by both p- and s-polarized light. It is found that the magnitude and the sign of curvature of the angular dependence of AR are related to the degree of resonance with light of either only p-polarization or both polarizations simultaneously.