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首页> 外文期刊>Optics and Spectroscopy >Statistical Properties of Surfaces: Features of the Calculation of the Autocovariance Function from the Scattering Indicatrix
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Statistical Properties of Surfaces: Features of the Calculation of the Autocovariance Function from the Scattering Indicatrix

机译:曲面的统计特性:根据散射指标计算自协方差函数的特征

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摘要

Features of the calculation of the autocovariance function (ACF) of an isotropic surface from experiments on measuring the angular dependence of scattered light are analyzed. The analytical extrapolation of the experimentally obtained function of power spectral density (PSD) of the surface relief based on the application of an adequate model for its description is shown to improve the accuracy of calculations of ACF. In this case, the mean-square roughness of the surface microrelief δ_(TIS)~2 determined from the data of total integrated scattering (TIS) allows the quantitative normalization of the ACF to be carried out. In the studies of the structure of a complicated surface (a superposition of isotropic and periodic components), the inclusion of PSD features allows one to carry out adequate statistical analysis by using techniques for calculating the ACF of homogeneous isotropic surfaces. The answer to this question is in the detailed study of experimentally obtained dependences of PSD and identification of their domains corresponding to isotropic scatterers, periodic structures, or characteristic dimensions at the surface. The validity of the proposed approach is confirmed by independent studies with the use of atomic force microscopy (AFM).
机译:通过测量散射光的角度依赖性实验,分析了各向同性表面的自协方差函数(ACF)的计算特征。基于适当描述模型的应用,对表面起伏的实验获得的功率谱密度(PSD)函数进行了分析外推,结果表明该方法可以提高ACF的计算精度。在这种情况下,根据总积分散射(TIS)数据确定的表面微浮雕δ_(TIS)〜2的均方粗糙度可以实现ACF的定量归一化。在研究复杂表面的结构(各向同性和周期性分量的叠加)时,通过包含PSD特征,可以使用计算均质各向同性表面的ACF的技术进行适当的统计分析。这个问题的答案是在对PSD的实验依赖性进行的详细研究中,以及对与各向同性散射体,周期性结构或表面特征尺寸相对应的PSD域的识别。通过使用原子力显微镜(AFM)进行的独立研究证实了该方法的有效性。

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