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首页> 外文期刊>Optics and Spectroscopy >The Use of Statistical Characteristics of Photon Trajectories for the Tomographic Studies of Optical Macroheterogeneities in Strongly Scattering Objects
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The Use of Statistical Characteristics of Photon Trajectories for the Tomographic Studies of Optical Macroheterogeneities in Strongly Scattering Objects

机译:利用光子轨迹的统计特性对强散射物体中的光学宏观非均质性进行层析成像研究

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摘要

Application possibilities of the statistical characteristics of photons for the study of macroheterogeneities, in strongly scattering tissue-like objects by means of optical computer tomography are considered. The presented technique is based on the approximation of the diffusion equation and is suitable for the subsequent application in the algorithm of reconstruction of the structure of an inhomogeneous object. It is demonstrated that the shadow from an inhomogeneity inside an object of any shape can be calculated with the use of a presentation of integrals along the mean trajectory of the photons. The influence of the shape of an object on the statistical characteristics of the photons trajectories is studied, namely: the trajectory R(#tau#) of the center of the statistical distribution of photons, RMS deviation #DELTA#(#tau#) and the quantity d#tau#/(dl) (#tau#) inverse proportional to the speed of motion of the center of distribution. The comparative study of three main geometries of objects (semiinfinite medium, flat layer, and rectangular sector) showed that the trajectory R(#tau#) can be approximated with sufficient accuracy by a three-step broken line and that the RMS deviation #DELTA#(#tau#) and the quantity d#tau#/(dl) (#tau#) can be replaced, in the general case, by simplified functions. The dependences that allow one to determine the parameters of the sh
机译:考虑了光子的统计特性在通过光学计算机断层摄影术在强散射的组织状物体中研究宏观异质性的应用可能性。所提出的技术基于扩散方程的近似,并且适合于随后在重建非均匀物体的结构的算法中的应用。已经证明,可以通过使用沿着光子平均轨迹的积分表示来计算来自任何形状的物体内部的不均匀性的阴影。研究了物体形状对光子轨迹统计特性的影响,即:光子统计分布中心的轨迹R(#tau#),RMS偏差#DELTA#(#tau#)和数量d#tau#/(dl)(#tau#)与分布中心的运动速度成反比。对物体的三种主要几何形状(半无限介质,平坦层和矩形扇区)的比较研究表明,轨迹R(#tau#)可以通过三步虚线以足够的精度逼近,并且RMS偏差#DELTA在一般情况下,#(#tau#)和数量d#tau#/(dl)(#tau#)可以用简化函数代替。可以确定sh参数的依赖项

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