Determination of the Depth of Reflected-Light Formation in Metal Films by Magnetooptical Method

摘要

Magnetooptical properties of thin electrolytic nickel films of different thicknesses, deposited on copper and platinum substrates, and magnetooptical properties of nickel samples coated with thin copper films are studied. From the measurements of the dependences of the equatorial Kerr effect on the thickness of magnetic films deposited on a nonmagnetic substrate, the depth of formation of reflective magnetooptical properties in a ferromagnetic is obtained. From similar dependences of the equatorial Kerr effect in a ferromagnetic coated with nonmagnetic films, the depth of reflected-light formation in a nonmagnetic material is determined. Theresults obtained in the study suggest that the depth of reflected-light formation and the depth of formation of reflective magnetooptical effects in materials with strong absorption are determined by the depth of light penetration.