Optical tensor tomography of residual stresses in waveguides

摘要

Algorithms for determining residual stresses in glass round waveguides by the method of integrated photoelasticity are considered. It is assumed that the residual deformation tensor is of thermal character and is characterized by fictitious temperature varying over the sample. The reconstruction is based on measuring characteristic parameters of polarized light and is carried out by the tomographic method in the plane orthogonal to the waveguide axis.