Photoreflection Signal Formation within the Framework of Wave Optics in Thermal Wave Studies of Solid-State Objects

摘要

The general approach for determining the photoreflection signal from solid-state objects is developed within the framework of wave optics. It is shown that, in the general case, the photoreflection signal is affected by the modulation of reflectivity and phase shift of probing radiation, both of which are caused by temperature waves induced in a sample. The conditions are determined under which the formation of the photoreflection signal is governed primarily by the modulation of the reflection coefficient for the intensity of probing radiation.