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Two-photon fluorescence scanning near-field microscopy based on a focused evanescent field under total internal reflection

机译:基于全内反射下的聚焦消逝场的双光子荧光扫描近场显微镜

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We present two-photon fluorescence near-field microscopy based on an evanescent field focus produced by a ring beam under total internal reflection. The evanescent field produced by this method is focused by a high-numerical-aperture objective, producing a tightly confined volume that can effectively induce two-photon excitation. The imaging system is characterized by the two-photon-excited images of the nanocrystals, which show that the focused evanescent field is split into two lobes because of the enhancement of the longitudinal polarization component at the focus. This feature is confirmed by the theoretical prediction. Unlike other two-photon near-field probes, this method does not have the heating effect and requires no control mechanism of the distance between a sample and the probe.
机译:我们提出了基于光环在全内反射下产生的e逝场焦点的双光子荧光近场显微镜。通过此方法产生的e逝场由高数值孔径的物镜聚焦,从而产生可以有效地引发双光子激发的紧密限制的体积。该成像系统的特征在于纳米晶体的双光子激发图像,这表明聚焦的e逝场由于焦点处的纵向偏振分量的增强而被分为两个瓣。理论上的预测证实了这一特征。与其他双光子近场探针不同,该方法没有加热效果,并且不需要控制样品和探针之间距离的机制。

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    《Optics Letters 》 |2003年第20期| 共3页
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  • 正文语种 eng
  • 中图分类 光学 ;
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