首页> 外文期刊>Optics & photonics news >Ultrafast Measurements Using a Silicon-Chip-Based Temporal Lens
【24h】

Ultrafast Measurements Using a Silicon-Chip-Based Temporal Lens

机译:使用基于硅芯片的时间透镜进行超快速测量

获取原文
获取原文并翻译 | 示例
获取外文期刊封面目录资料

摘要

Sample measurements of single iso-lated events on the sub-picosecondtime scale are of great interest for awide range of applications, includingnext-generation high-speed opticalcommunications, the observation ofextreme physical interactions and probesof chemical and biological processes.Current electronic oscilloscopes andphotodetectors are capable of single-shotmeasurements of waveforms with 30-psresolution. Several nonlinear opticaltechniques have also been developed tomeasure optical waveforms with few-femtosecond accuracy. However, theyhave been restricted to single-shot recordlengths of tens of picoseconds and havelimited update rates.
机译:亚皮秒级的单个孤立事件的样品测量对于广泛的应用非常重要,包括下一代高速光通信,观察极端的物理相互作用以及化学和生物过程的探针。当前的电子示波器和光电探测器能够分辨率为30 ps的波形的单次测量还开发了几种非线性光学技术来以几飞秒的精度测量光波形。但是,它们已被限制为几十皮秒的单次记录长度,并且更新速度有限。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号