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首页> 外文期刊>Optics Letters >Phase determination in interference-based superresolving microscopes through critical frequency analysis
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Phase determination in interference-based superresolving microscopes through critical frequency analysis

机译:基于临界频率分析的基于干涉的超分辨显微镜的相位确定

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摘要

Utilizing the interference of wave fronts of two opposing lenses, 4Pi-confocal and I~(5)M microscopy improve the axial resolution of far-field fluorescence microscopy as much as threefold to sevenfold. However, establishing the phase difference of the wave fronts in the sample is a problem yet to be solved. Here we show that the phase difference is encoded in the microscope's transfer of the spatial frequencies that match the distance of the interference peaks. As a result the phase difference is readily extracted through a Fourier transform of the image. Our method is relevant to all microscopes that exploit the interference of counterpropagating waves to improve the axial and the lateral resolution.
机译:利用4Pi-conocal和I〜(5)M显微镜对两个相对透镜的波阵面进行干涉,可将远场荧光显微镜的轴向分辨率提高三倍至七倍。然而,在样品中建立波前的相位差是尚未解决的问题。在这里,我们表明相位差是在显微镜的与干扰峰的距离相匹配的空间频率的传递中编码的。结果,可以通过图像的傅立叶变换容易地提取相位差。我们的方法与所有利用反向传播波的干涉以改善轴向和横向分辨率的显微镜有关。

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