Nondestructive Testing of the Thermal Resistance of Gann Diodes during Their Manufacture

V. I. Yurchenko; N. M. Yurchenko

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Nondestructive Testing of the Thermal Resistance of Gann Diodes during Their Manufacture

机译：江恩二极管制造过程中热阻的无损检测

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摘要

The results of an investigation of the thermal resistance of Gunn diodes at different process technology cycles of their manufacturing are considered.

机译：考虑了耿氏二极管在其制造的不同工艺技术周期下的热阻研究结果。

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来源
《Russian Journal of Nondestructive Testing》 |2012年第4期|共5页
作者
V. I. Yurchenko; N. M. Yurchenko;
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原文格式 PDF
正文语种 eng
中图分类 TH172;
关键词
microwave power; Gunn diodes; measurement of thermal resistance and testing;

机译：微波功率;耿氏二极管;热阻测量和测试;

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Nondestructive Testing of the Thermal Resistance of Gann Diodes during Their Manufacture

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