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Influenta procesului de delimitare asupra caracteristicilor fotodetectorilor pe baza de PbS

机译:划界过程对基于PbS的光电探测器特性的影响

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摘要

Photoconductive PbS thin films deposited on glass substrate by Chemical Bath Deposition(CBD)must be delimited for obtaining the suitable configuration.It was applied a photolithographic method using a positive photoresist AZ1350.The influence of reagents and the other treatments used during this process,on the electrical(sheet electrical resistance)and photoelectrical parameters(specific detectivity),ofphotodetectors respectively,was studied.The variation of the parameters was determined after each stage and overall.It was observed that the reagents and the treatments applied in the delimitation process,without reducing the photosensitive area,determined an average increasing of sheet electrical resistance with 40 % and noteworthy improving of detectivity.After diminution of photoconductive area 32,14 times,and adequate thermal treatment,the specific detectivity increased from 10~9 to 10~(11)cm centre dot Hz~(1/2)w~(-1),at 300 K temperature.The studied photolithographic method could be applied successfully in photodetectors manufacturing.
机译:必须对通过化学浴沉积(CBD)沉积在玻璃基板上的光电导PbS薄膜进行定界以获得合适的配置。使用正性光致抗蚀剂AZ1350进行光刻方法。该过程中试剂和其他处理方法的影响分别研究了光电探测器的电气(薄层电阻)和光电参数(比检测率)。确定了每个阶段后和整个过程后参数的变化。观察到试剂和处理方法在定界过程中没有使用减小光敏面积,确定片电阻平均增加40%,并显着提高检测率。将光电导面积减小32.14倍,并进行适当的热处理后,比检测率从10〜9增加到10〜(11 )cm中心点Hz〜(1/2)w〜(-1),在300 K温度下。成功应用于光电探测器制造。

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