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Alternative procedure for LR 115 chemical etching and alpha tracks counting

机译:LR 115化学蚀刻和Alpha轨道计数的替代程序

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摘要

An improved procedure for etching and analysis of alpha tracks induced in LR-115 detectors is proposed with the advantages of simplicity and its relatively low cost. A new type of detector holder was designed to etch and rinse efficiently up to 100 detectors. We develop a simple and reliable methodology with a semiautomatic track count using a Nikon digital camera coupled to a PC and employing software "SCION" freely available on the Internet. Track images are binarized prior the application of software "SCION" so that original track shapes are not distorted, space resolution is improved and track counting has low dependence on focus and illumination level. High discrimination for tracks is achieved when marks and rips perturb the detector surface. An image generator of nuclear tracks is included to study the effect of track overlapping effect on counting. (c) 2005 Elsevier Ltd. All rights reserved.
机译:提出了一种改进的蚀刻和分析在LR-115检测器中感应到的alpha轨迹的方法,其优点是简单易行且成本相对较低。设计了一种新型检测器支架,可有效蚀刻和冲洗多达100个检测器。我们开发了一种简单可靠的方法,使用尼康数码相机连接到PC并使用Internet上免费提供的软件“ SCION”,从而实现半自动跟踪计数。在使用“ SCION”软件之前,对轨迹图像进行二值化处理,以使原始轨迹形状不会失真,空间分辨率得到改善,并且轨迹计数对焦点和照明水平的依赖性较低。当标记和裂痕扰动检测器表面时,可实现对轨迹的高度区分。包含核径迹的图像生成器以研究径迹重叠效应对计数的影响。 (c)2005 Elsevier Ltd.保留所有权利。

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