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Radiation chemical yields for the losses of typical functional groups in PADC films for high energy protons registered as unetchable tracks

机译:记录为不可蚀刻轨道的高能质子的PADC膜中典型官能团损失的辐射化学产率

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摘要

A series of FT-IR spectrometric studies has been performed to understand the latent track structure in poly(allyl diglycol carbonate), PADC, which were exposed to proton beams with energies of 20, 30 and 70 MeV. These energies are too high to register etchable tracks in PADC. Chemical damage parameters, such as damage density, effective track core radius and radiation chemical yields, for losses of ether bond, carbonate ester bond and CH groups in PADC are evaluated as a function of the stopping power, which were compared to the previous results for 5.7 MeV proton and heavy ions, between He and Xe. Graphs of the chemical damage parameters are given at the wide stopping powers ranging from 1 to 12,000 key/mu m. The decreasing behaviors of the ether and carbonate ester bonds are on the almost identical trends with those of the heavy ions. On the contrary to this, the reducing behavior of CH groups is similar to that of the gamma rays. Different dependence of the chemical damage parameters for the loss of CH groups is found on the stopping powers between the both sides of the detection threshold as an etched track detector. (C) 2016 Elsevier Ltd. All rights reserved.
机译:已经进行了一系列的FT-IR光谱研究,以了解聚(碳酸二烯丙二醇丙酯)PADC中的潜在轨道结构,这些结构暴露于能量为20、30和70 MeV的质子束中。这些能量太高,无法在PADC中记录可蚀刻的轨迹。评估PADC中醚键,碳酸酯键和CH基团的损失的化学损伤参数,如损伤密度,有效轨道芯半径和辐射化学收率,将其作为制动力的函数,并将其与先前的结果进行比较氦和氙之间的5.7 MeV质子和重离子。在1至12,000键/μm的宽终止功率下给出了化学损伤参数的图表。醚和碳酸酯键的下降行为与重离子的下降趋势几乎相同。与此相反,CH基团的还原行为类似于伽马射线的还原行为。对于作为蚀刻轨迹检测器的检测阈值两侧之间的停止功率,发现化学损伤参数对CH基团丢失的依赖性不同。 (C)2016 Elsevier Ltd.保留所有权利。

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