Microhardness and radiation damage studies of proton irradiated Kapton films

摘要

Kapton films were irradiated with a 3 MeV proton beam at different fluences. The microhardness, and electrical properties were studied using microhardness tester and LCR bridge, respectively. It is observed that hardness of the film increases significantly as fluence increases. The true bulk hardness of the film was obtained at loads greater than 400 mN. There is an exponential increase in the conductivity with frequency but effect of irradiation is not significant. The dielectric loss and dielectric constant are observed to change significantly due to irradiation. (C) 2003 Elsevier Ltd. All rights reserved. [References: 10]