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Photo-emf detector enables laser ultrasonic receiver

机译:光电感应探测器可实现激光超声波接收器

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摘要

Conventional photodetectors typically are used to provide a signal proportional to the power of an incident beam of light. In recent years, a new photoeletector has been developed based on the nonsteady-state photoelectromotive force (photo-emf). Exciting advances in the field and a real-time demonstration of the detector technology as applied to laser ultrasonic inspection, were offered as part of CLEO 2000 (San Francisco, CA) last May (see frontis). This new detector produces an output signal proportional to the transient lateral motion of an incident optical pattern on its surface. When the pattern is stationary, no output signal is produced, regardless of the location or amount of incident power. This detector can be incorporated into an optical interferometer that can measure ultrasonic waves in materials, just as a conventional contact PZT ultrasonic transducer does, but without contacting the sample under inspection. The special properties of this detector permit in-process ultrasonic inspection in industrial environments where background vibrations, rough surfaces, high temperatures, and rapid process motions would foil both contact PZT transducers and traditional laser interferometers.
机译:传统的光电探测器通常用于提供与入射光束功率成正比的信号。近年来,基于非稳态光电动势(photo-emf)开发了一种新的光电发射器。去年5月,作为CLEO 2000(位于加利福尼亚州旧金山)的一部分,提供了该领域令人激动的进展以及用于激光超声检查的检测器技术的实时演示(请参阅frontis)。这种新的检测器在其表面上产生与入射光学图案的瞬时横向运动成比例的输出信号。当图案静止时,无论入射功率的位置或数量如何,都不会产生输出信号。可以将这种检测器安装到光学干涉仪中,该光学干涉仪可以像常规的接触式PZT超声换能器一样测量材料中的超声波,但不接触被检样品。该检测器的特殊性能允许在工业环境中进行过程中超声波检查,在工业环境中,背景振动,粗糙表面,高温和快速的过程运动会挫败接触式PZT传感器和传统的激光干涉仪。

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