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首页> 外文期刊>Lasers in engineering >Characteristic Analysis of the Response to Picosecond Pulsed Laser Radiation of a Silicon p-i-n Photodiode
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Characteristic Analysis of the Response to Picosecond Pulsed Laser Radiation of a Silicon p-i-n Photodiode

机译:硅p-i-n光电二极管对皮秒脉冲激光辐射响应的特性分析

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摘要

To study the characteristic response of a silicon p-i-n photodiode to picosecond pulsed laser radiation, the physical model was established and the response characteristic was analysed using quasi-three-dimensional simulation technology. The results indicate that a silicon p-i-n photodiode could respond to the intensity of the picosecond pulsed laser while peak responsibility approximately linearly degrading with the laser pulse duration narrowing, and that it could not recognize pulse duration. The experiment was carried out to verify the theoretical analysis results. The experimental results are shown to be in good agreement with the theoretical results.
机译:为了研究硅p-i-n光电二极管对皮秒脉冲激光辐射的特性响应,建立了物理模型,并使用准三维仿真技术分析了响应特性。结果表明,硅p-i-n光电二极管可以响应皮秒脉冲激光的强度,而峰值响应随激光脉冲持续时间的变窄而线性近似地降低,并且无法识别脉冲持续时间。进行实验以验证理论分析结果。实验结果与理论结果吻合良好。

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