...
首页> 外文期刊>Journal of Applied Physics >Electro-optical measurements of picosecond bunch length of a 45 MeV electron beam
【24h】

Electro-optical measurements of picosecond bunch length of a 45 MeV electron beam

机译:

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

We have measured the temporal duration of 45 MeV picosecond electron beam bunches using a noninvasive electro-optical (EO) technique. The amplitude of the EO modulation was found to increase linearly with electron beam charge and decrease inversely with distance from the electron beam. The rise time of the temporal signal was limited by our detection system to similar to 70 ps. The EO signal due to ionization caused by the electrons traversing the EO crystal was also observed. It has a distinctively long decay time constant and signal polarity opposite to that due to the field induced by the electron beam. The electro-optical technique may be ideal for the measurement of bunch length of femtosecond, relativistic, high energy, charged, particle beams. (C) 2001 American Institute of Physics. References: 18

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号