Scanning electron microscopy of metal surfaces-some new techniques-part 1

摘要

Thanks to the development of a new SEM technique, a significantly improved depth of focus can be obtained in the examination of metal surfaces, at the same time allowing use of much simplified sample preparation techniques. In Part 1, examples are presented showing the application of the new method to anodised metals and to conversion coatings. Moving through various stages, magnifications of up to 250,000 can be obtained.