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Field emission from isolated individual vertically aligned carbon nanocones

机译:来自孤立的单个垂直排列的碳纳米锥的场发射

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摘要

Field emission from isolated individual vertically aligned carbon nanocones (VACNCs) has been measured using a small-diameter moveable probe. The probe was scanned parallel to the sample plane to locate the VACNCs, and perpendicular to the sample plane to measure the emission turn-on electric field of each VACNC. Individual VACNCs can be good field emitters. The emission threshold field depends on the geometric aspect ratio (height/tip radius) of the VACNC and is lowest when a sharp tip is present. VACNCs exposed to a reactive ion etch process demonstrate a lowered emission threshold field while maintaining a similar aspect ratio. Individual VACNCs can have low emission thresholds, carry high current densities, and have long emission lifetime. This makes them very promising for various field emission applications for which deterministic placement of the emitter with submicron accuracy is needed.
机译:使用小直径可移动探针测量了孤立的单个垂直排列的碳纳米锥 (VACNC) 的场发射。将探头平行于样品平面扫描以定位 VACNC,并垂直于样品平面以测量每个 VACNC 的发射导通电场。单个 VACNC 可以成为良好的场发射器。发射阈值场取决于 VANCC 的几何纵横比(高度/尖端半径),当存在尖锐尖端时,发射阈值场最低。暴露于反应离子蚀刻工艺的 VACNC 在保持相似纵横比的同时表现出较低的发射阈值场。单个 VACNC 可以具有低发射阈值、高电流密度和较长的发射寿命。这使得它们在各种场发射应用中非常有前途,这些应用需要以亚微米精度确定发射器的位置。

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