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机译:
Ceramics Laboratory, Swiss Federal Institute of Technology, 1015 Lausanne, Switzerland;
机译:On the origin of polarization fatigue and Curie-von Schweidler relaxation current in Pb(Zr-x,Ti1-x)O-3 ferroelectric thin films: A unique mechanism based on charge trapping by interface defects
机译:Effect of textured Pb(Zr_(1-x)Ti_(x))O_(3) seed layer on fatigue properties of ferroelectric Pb_(0.99)(Zr_(0.6)Sn_(0.4))_(0.85)Ti_(0.15)_(0.98)Nb_(0.02)O_(3) thin films
机译:Publisher’s Note: “On the origin of polarization fatigue and Curie–von Schweidler relaxation current in Pb(Zrx,Ti1−x)O3 ferroelectric thin films: A unique mechanism based on charge trapping by interface defects” J. Appl. Phys. 133, 014101 (2023)
机译:通过溅射Pb(Mn,Nb)O_(3)-PB(Zr,Ti)O_(3)薄膜(3)薄膜开发4 GHz散装声波谐振器
机译:压电瘤应用Pb(Zr0.3Ti0.7)O3薄膜对缩放效应对缩放效应的影响
机译:PB1-Xlax(Zr0.52Ti0.48)的压电性能1-X / 4O3薄膜通过原位X射线衍射研究
机译:低温烧结PB(MG1 / 2W1 / 2)O3-PB(MN1 / 3NB2 / 3)O3-PB(ZR1 / 2TI1 / 2)O3-PB(MG1 / 2W1 / 2)O3的o3-Pb(Zr1 / 2Ti1 / 2)O 3的压电和介电特性。
机译:studies of ferroelectric heterostructure thin films and interfaces via in situ211 analytical techniques