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机译:
Univ Illinois, Dept Chem Engn, Chicago, IL 60607, USA, .;
机译:Characterization of Silicon Dioxide Films on a 4H-SiC Si(0001) Face by Fourier Transform Infrared (FT-IR) Spectroscopy and Cathodoluminescence Spectroscopy
机译:The study of the thermal oxide films on silicon wafers by Fourier transform infrared attenuated total reflection spectroscopy
机译:Commercial Silicon Nitride Powders Surface Groups Measured by Diffuse Reflectance Infrared Fourier Transform Spectroscopy
机译:structural characterization of vanadium oxide catalysts supported on nanostructured silica sBa-15 using X-ray absorption spectroscopy