Characterization in the extreme ultraviolet (XUV) domain of microchannel plate based device using synchrotron radiation

摘要

Innovative, low-loss, and compact optical systems are essential to meet the experimental requirements of emerging novel radiation sources. The microchannel plate (MCP), a metamaterial-based optical device, shows promising potential for shaping, condensing, and focusing soft x-ray radiation at synchrotron radiation (SR) facilities. This study highlights the impact of MCP optical devices on SR beam condensing capability and their sensitivity to the degree of coherence by investigating the profile of transmitted beams through single and double MCP optical devices. Transmitted diffraction patterns of soft x-ray SR radiation change with energy and radiation modes. At 92 eV, the double MCP-based device affects the beam divergence and degree of coherence more than the single MCP. Moreover, the double MCP device shows potential as a condensing optics at shorter wavelengths, i.e., 480 eV. Experiments were performed at the available end-station of the Circular Polarization beamline at the Elettra synchrotron facility in Trieste, using a high-vacuum chamber with a hexapod system, providing the precise movement necessary to align these diffractive optics. The findings contribute to the development of innovative optical systems for SR and free-electron laser beamlines, paving the way for advanced experiments in spectroscopy, microscopy, and imaging in a wide energy range.