...
机译:
Purdue University;
Sandia National Laboratories;
Sonrisa Research, Inc.;
机译:Capacitance–voltage characterization of metal–insulator–semiconductor capacitors formed on wide-bandgap semiconductors with deep dopants such as diamond
机译:Detection of defect levels in vicinity of Al2O3/p-type GaN interface using sub-bandgap-light-assisted capacitance-voltage method
机译:Quantum mechanical influence and estimated errors on interface-state density evaluation by quasi-static C-V measurement