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Fluorous-inorganic hybrid dielectric materials for solution-processed electronic devices

机译:用于溶液处理电子设备的氟无机混合介电材料

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We report the synthesis and characterisation of fluorous-inorganic hybrid dielectric (FIHD) materials processable in highly fluorinated orthogonal solvents for printed electronic devices. FIHD materials were prepared successfully via ligand exchange reactions between organic ligands on the surfaces of nanomaterials and highly fluorinated carboxylic acids. When hafnium oxide (HfO2) or zirconium oxide (ZrO2) nanoparticles stabilized with trioctylphosphine oxide (TOPO) were treated with perfluoro-3,6,9-trioxatridecanoic acid in HFE-7500 at 130 degrees C, the modified surface characteristics of the nanoparticles resulted in excellent solubilities in the fluorous solvent. The dielectric constant of HfO2 and ZrO2 nanoparticles modified with fluorous acid was ca. 4.4 and 4.3 at 1 KHz, respectively, which is significantly higher than that of fluoropolymers. Top-gate organic thin film transistors (OTFTs) were fabricated using solution-processed organic semiconductors and HfO2-based FIHD materials. The hole mobilities of the OTFTs produced were as high as 0.08 cm(2) V-1 s(-1) (V-ds = -40 V) and the on/off ratio reached 3.3 x 10(6) when 2,8-difluoro-5,11-bis(triethylsilylethynyl)anthradithiophene (diF-TESADT) was employed as the semiconductor layer. These device performances demonstrate that FIHD materials can be useful components for general printed electronic devices processed with soluble organic electronic materials.
机译:我们报告了可在印刷电子设备的高度氟化正交溶剂中加工的氟-无机杂化电介质(FIHD)材料的合成和表征。 FIHD材料是通过纳米材料表面的有机配体与高度氟化的羧酸之间的配体交换反应成功制备的。当用三氟氧化膦(TOPO)稳定的氧化ha(HfO2)或氧化锆(ZrO2)纳米颗粒在HFE-7500中于130℃下用全氟-3,6,9-三氧杂癸酸处理时,得到的纳米颗粒改性后的表面特性在氟溶剂中具有极好的溶解性。用氟酸改性的HfO2和ZrO2纳米粒子的介电常数约为。在1 KHz下分别为4.4和4.3,这明显高于含氟聚合物。顶栅有机薄膜晶体管(OTFT)使用溶液处理的有机半导体和基于HfO2的FIHD材料制成。产生的OTFT的空穴迁移率高达0.08 cm(2)V-1 s(-1)(V-ds = -40 V),当2,8时开/关比达到3.3 x 10(6) -二氟-5,11-双(三乙基甲硅烷基乙炔基)蒽噻吩(diF-TESADT)被用作半导体层。这些设备性能证明,FIHD材料可以用作使用可溶性有机电子材料处理的普通印刷电子设备的有用组件。

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