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Molecular-beam epitaxy and characteristics of GaN_(y)As_(1-x-y)Bi_(x)

机译:GaN_(y)As_(1-x-y)Bi_(x)的分子束外延和特性

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摘要

GaN_(y)As_(1-x-y)Bi_(x) alloys were grown by molecular-beam epitaxy using solid Ga, Bi, and As sources and nitrogen radicals generated from nitrogen gas in rf plasma. Changing the growth temperature is found to be a convenient method for controlling the GaBi molar fraction in the alloy reproducibly. The photoluminescence (PL) spectra show that the PL peak energy of GaN_(y)As_(1-x-y)Bi_(x) alloy decreased with increasing GaBi and GaN molar fractions. The redshift coefficients of approx62 meV/(percent)Bi and approx130 meV/(approx)N at the PL peak energy of GaN_(y)As_(1-x-y)Bi_(x) were observed at room temperature. The temperature dependence of the PL peak energy in the temperature range of 150-300 K is much smaller than the temperature dependence of the band gap of InGaAsP. The temperature coefficients of GaAs_(1-x)Bi_(x) and GaN_(y)As_(1-x-y)Bi_(x) band gaps are governed by the GaBi molar fraction and they decrease with increasing GaBi molar fraction. GaN_(y)As_(1-x-y)Bi_(x) alloys with different PL peak energies and lattice matched to GaAs substrates were obtained. The photoluminescence peak energy was located at a predicted wavelength for the sample lattice matched to GaAs which was found to have the structure of Ga(N_(0.33)Bi_(0.67))_(z)As_(1-z).
机译:GaN_(y)As_(1-x-y)Bi_(x)合金使用固体Ga、Bi和As源以及射频等离子体中氮气产生的氮自由基通过分子束外延生长。研究发现,改变生长温度是可重复地控制合金中GaBi摩尔分数的便捷方法。光致发光(PL)光谱表明,GaN_(y)As_(1-x-y)Bi_(x)合金的PL峰值能量随着GaBi和GaN摩尔分数的增加而降低。在室温下,在GaN_(y)As_(1-x-y)Bi_(x)的PL峰值能量下,红移系数约为62 meV/(percent)Bi和约130 meV/(大约)N。在150-300 K温度范围内,PL峰值能量的温度依赖性远小于InGaAsP带隙的温度依赖性。GaAs_(1-x)Bi_(x)和GaN_(y)As_(1-x-y)Bi_(x)带隙的温度系数由GaBi摩尔分数控制,并随着GaBi摩尔分数的增加而减小。获得了具有不同PL峰值能量的GaN_(y)As_(1-x-y)Bi_(x)合金和与GaAs衬底相匹配的晶格。光致发光峰值能量位于与GaAs匹配的样品晶格的预测波长处,发现GaAs具有Ga(N_(0.33)Bi_(0.67))_(z)As_(1-z)的结构。

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