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机译:
Natl Inst Stand & Technol;
机译:Enhanced sensitivity to force gradients by using higher flexural modes of the atomic force microscope cantilever
机译:The simultaneous measurement of elastic, electrostatic and adhesive properties by scanning force microscopy: pulsed-force mode operation
机译:Improving sensitivity in electrostatic force detection utilizing cantilever with tailored resonance modes
机译:Lorentz Force MEMS Magnetometer Using CW/CCW Modes on Quad Mass Resonator