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Shallow Donor Ionization Energy in Sn-Doped ZnO Nanobelts

机译:Sn掺杂ZnO纳米带中的浅施主电离能

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Donor states of Sn dopants and electronic structures in Sn-doped ZnO nanobelts have been investigated by combining temperature-dependent photoluminescence (PL) and first-principles calculations. The strong and dominant donor-bound exciton ((DX)-X-0) emission was observed in low-temperature PL spectrum of Sn-doped ZnO nanobelts. The (DX)-X-0 emission has thermal activation energy of similar to 12 meV and the corresponding ionization energy was determined to be similar to 60 meV, which is derived from shallow donor nature of Sn dopants. In addition, the (DX)-X-0 peak dissociates into a neural-donor-like defect-pair complex and band-to-band transition with increasing temperature. As a result, the near-band-edge emission peak at room temperature is ascribed to a mixture of band-to-band and free-to-bound transition. Furthermore, first-principles electronic structure calculations indicate that Sn substituting Zn site in ZnO is a rather shallow donor, in good agreement with the PL results.
机译:通过结合温度相关的光致发光(PL)和第一性原理计算,研究了Sn掺杂的ZnO纳米带中Sn掺杂剂的电子给体状态和电子结构。在掺Sn的ZnO纳米带的低温PL光谱中观察到了强的和主要的供体结合激子((DX)-X-0)发射。 (DX)-X-0发射具有类似于12 meV的热活化能,并确定了相应的电离能类似于60 meV,这是由Sn掺杂剂的浅施主性质得出的。此外,随着温度升高,(DX)-X-0峰解离为神经供体样缺陷对复合物,并发生了带间跃迁。结果,室温下的近带边缘发射峰归因于带到带和自由到带的过渡的混合。此外,第一性原理电子结构计算表明,在ZnO中用Sn取代Zn的Sn是一个较浅的供体,与PL结果非常吻合。

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