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On-chip single nanoparticle detection and sizing by mode splitting in an ultrahigh-Q microresonator

机译:通过超高Q微谐振器中的模式分裂对芯片上的单个纳米颗粒进行检测和调整尺寸

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The ability to detect and size individual nanoparticles with high resolution is crucial to understanding the behaviour of single particles and effectively using their strong size-dependent properties to develop innovative products. We report real-time, in situ detection and sizing of single nanoparticles, down to 30 nm in radius, using mode splitting in a monolithic ultrahigh-quality-factor (Q) whispering-gallery-mode micro-resonator. Particle binding splits a whispering-gallery mode into two spectrally shifted resonance modes, forming a self-referenced detection scheme. This technique provides superior noise suppression and enables the extraction of accurate particle size information with a single-shot measurement in a microscale device. Our method requires neither labelling of the particles nor a priori information on their presence in the medium, providing an effective platform to study nanoparticles at single-particle resolution.
机译:以高分辨率检测并确定单个纳米颗粒大小的能力对于理解单个颗粒的行为以及有效利用其强大的尺寸依赖性特性来开发创新产品至关重要。我们报告了实时,原位检测和定型的单个纳米粒子的大小,半径小于30 nm,使用单片超高质量因子(Q)耳语画廊模式微谐振器中的模式分裂。粒子绑定将耳语画廊模式分为两个频谱偏移的共振模式,从而形成了自参考检测方案。该技术可提供出色的噪声抑制能力,并能够通过在微型设备中进行单次测量来提取准确的粒度信息。我们的方法既不需要标记颗粒,也不需要有关它们在介质中的存在的先验信息,从而提供了一个有效的平台来研究单颗粒分辨率下的纳米颗粒。

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