Uncovering operational mechanisms of a single-walled carbon nanotube network device using local probe electrical characterizations

摘要

The apparent field-effect-transistor (FET)-like operations of a device based on a network of single-walled carbon nanotubes (SWCNTs) are elucidated with the help of local probe electrical characterization methods using an atomic force microscope. The apparent switching behavior of the device with an on-off ratio > 10~4 is found to be due to just two localized areas in the network of SWCNTs based on the measurements by electrostatic force microscopy and scanning gate microscopy. The result demonstrates that the conductance of a network of SWCNTs can be dominated by localized perturbations.