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Lattice distortion and luminescence of CdSe/ZnSe nanocrystals

机译:CdSe / ZnSe纳米晶的晶格畸变和发光

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摘要

Colloidal CdSe/ZnSe core/shell nanocrystals were prepared via the conventional TOP/TOPO process and their shell thickness was controlled varying the ZnSe precursor concentration. X-ray diffraction (XRD) on the nanocrystals showed gradual peak shifts to high two-theta angles due to a decrease in the lattice parameter of CdSe cores with an increase in the ZnSe shell thickness. High-resolution transmission electron microscopy (HRTEM) images of the CdSe/ZnSe nanocrystals show a c-axis elongation with an increase in ZnSe precursor concentration and crystalline defect formation in some of the nanocrystals with 2.0 mM ZnSe precursor concentration, possibly due to high compressive strain. Photoluminescence (PL) spectra of the CdSe/ZnSe nanocrystals showed an increase in the peak intensity up to 1.0 mM ZnSe precursor concentration due to the surface passivation effect, and a decrease beyond this value, possibly due to the formation of crystalline defects such as stacking faults. The PL wavelength showed red-shifts up to 1.0 mM ZnSe precursor concentration due to the partial leakage of an electron wavefunction of CdSe cores into the ZnSe shells and blue-shifts beyond this value due to the high compressive strain from the ZnSe shells.
机译:胶体CdSe / ZnSe核/壳纳米晶体是通过常规的TOP / TOPO工艺制备的,通过改变ZnSe前驱体的浓度来控制其壳厚度。纳米晶体上的X射线衍射(XRD)显示,随着CdSe核晶格参数的减小和ZnSe壳层厚度的增加,峰的位移逐渐向高2θ角移动。 CdSe / ZnSe纳米晶体的高分辨率透射电子显微镜(HRTEM)图像显示,随着ZnSe前驱物浓度的增加,c轴伸长,并且在某些具有2.0 mM ZnSe前驱物浓度的纳米晶体中,晶体缺陷形成。应变。 CdSe / ZnSe纳米晶体的光致发光(PL)光谱显示,由于表面钝化效应,最高至1.0 mM ZnSe前体浓度的峰强度​​增加,而超过此值则下降,这可能是由于形成了晶体缺陷(例如堆积)故障。由于CdSe核的电子波函数部分泄漏到ZnSe壳中,PL波长显示出高达1.0 mM的ZnSe前体浓度的红移,由于ZnSe壳的高压缩应变,蓝移超过该值。

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