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Defective Interfaces in Yttrium-Doped Barium Zirconate Films and Consequences on Proton Conduction

机译:钇钇锆钡薄膜中的缺陷界面及质子传导的后果

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摘要

Yttrium-doped barium zirconate (BZY) thin films recently showed surprising electric transport properties. Experimental investigations conducted mainly by electrochemical impedance spectroscopy suggested that a consistent part of this BZY conductivity is of protonic nature. These results have stimulated further investigations by local unconventional techniques. Here, we use electrochemical strain microscopy (ESM) to detect electrochemical activity in BZY films with nanoscale resolution. ESM in a novel cross-sectional measuring setup allows the direct visualization of the interfacial activity. The local electrochemical investigation is compared with the structural studies performed by state of art scanning transmission electron microscopy (STEM). The ESM and STEM results show a clear correlation between the conductivity and the interface structural defects. We propose a physical model based on a misfit dislocation network that introduces a novel 2D transport phenomenon, whose fingerprint is the low activation energy measured.
机译:掺钇的锆酸钡(BZY)薄膜最近显示出令人惊讶的电传输性能。主要通过电化学阻抗谱进行的实验研究表明,该BZY电导率的一致部分具有质子性。这些结果激发了当地非常规技术的进一步研究。在这里,我们使用电化学应变显微镜(ESM)来检测具有纳米级分辨率的BZY膜的电化学活性。在新颖的横截面测量装置中,ESM可以直接显示界面活动。将局部电化学研究与通过最新技术的扫描透射电子显微镜(STEM)进行的结构研究进行了比较。 ESM和STEM结果表明,电导率和界面结构缺陷之间存在明显的相关性。我们提出了一种基于失配位错网络的物理模型,该模型引入了一种新颖的2D传输现象,其指纹是测得的低活化能。

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