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Raman spectroscopy and in situ raman spectroelectrochemistry of bilayer 12C/13C graphene

机译:双层12C / 13C石墨烯的拉曼光谱和原位拉曼光谱电化学

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摘要

Bilayer graphene was prepared by the subsequent deposition of a 13C single-layer graphene and a 12C single-layer graphene on top of a SiO_2/Si substrate. The bilayer graphene thus prepared was studied using Raman spectroscopy and in situ Raman spectroelectrochemistry. The Raman frequencies of the 13C graphene bands are significantly shifted with respect to those of 12C graphene, which allows us to investigate the single layer components of bilayer graphene individually. It is shown that the bottom layer of the bilayer graphene is significantly doped from the substrate, while the top layer does not exhibit a signature of the doping from the environment. The electrochemical doping has the same effect on the charge carrier concentration at the top and the bottom layer despite the top layer being the only layer in contact with the electrolyte. This is here demonstrated by essentially the same frequency shifts of the G and G′ bands as a function of the electrode potential for both the top and bottom layers. Nevertheless, analysis of the intensity of the Raman modes showed an anomalous bleaching of the Raman intensity of the G mode with increasing electrode potential, which was not observed previously in one-layer graphene.
机译:通过随后在SiO_2 / Si衬底顶部沉积13C单层石墨烯和12C单层石墨烯来制备双层石墨烯。使用拉曼光谱和原位拉曼光谱电化学研究了如此制备的双层石墨烯。 13C石墨烯带的拉曼频率相对于12C石墨烯的拉曼频率有明显的偏移,这使我们可以分别研究双层石墨烯的单层组分。可以看出,双层石墨烯的底层是从衬底上显着地掺杂的,而顶层则没有表现出来自环境的掺杂的特征。尽管顶层是与电解质接触的唯一层,但是电化学掺杂对顶层和底层的载流子浓度具有相同的影响。这在这里通过G和G'带的基本相同的频移证明,该频移作为顶层和底层的电极电势的函数。然而,对拉曼模式强度的分析显示,随着电极电位的增加,G模式的拉曼强度发生了异常的漂白,这是以前在单层石墨烯中未观察到的。

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