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首页> 外文期刊>Nano letters >Pump-intensity- and shell-thickness-dependent evolution of photoluminescence blinking in individual core/shell CdSe/CdS nanocrystals
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Pump-intensity- and shell-thickness-dependent evolution of photoluminescence blinking in individual core/shell CdSe/CdS nanocrystals

机译:泵浦强度和壳厚度依赖的光致发光在单个核/壳CdSe / CdS纳米晶体中的闪烁

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摘要

We report a systematic study of photoluminescence (PL) intensity and lifetime fluctuations in individual CdSe/CdS core/shell nanocrystal quantum dots (NQDs) as a function of shell thickness. We show that while at low pump intensities PL blinking in thin-shell (4-7 monolayers, MLs) NQDs can be described by random switching between two states of high (ON) and low (OFF) emissivities, it changes to the regime with a continuous distribution of ON intensity levels at high pump powers. A similar behavior is observed in samples with a medium shell thickness (10-12 MLs) without, however, the PL intensity ever switching to a complete "OFF" state and maintaining ca. 30% emissivity ("gray" state). Further, our data indicate that highly stable, blinking-free PL of thick-shell (15-19 MLs) NQDs ("giant" or g-NQDs) is characterized by nearly perfect Poisson statistics, corresponding to a narrow, shot-noise limited PL intensity distribution. Interestingly, in this case the PL lifetime shortens with increasing pump power and the PL decay may deviate from monoexponential. However, the PL intensity distribution remains shot-noise limited, indicating the absence of significant quantum yield fluctuations at a given pump power intensity during the experimental time window.
机译:我们报告了对单个CdSe / CdS核/壳纳米晶体量子点(NQDs)随壳厚度变化的光致发光(PL)强度和寿命波动的系统研究。我们显示,虽然在低泵浦强度下PL闪烁在薄壳(4-7个单层,ML)中,但NQD可以通过在高(ON)和低(OFF)发射率的两种状态之间随机切换来描述,但随着高泵浦功率下ON强度水平的连续分布。在具有中等壳厚度(10-12 MLs)的样品中观察到了类似的行为,但是PL强度从未切换到完全“ OFF”状态并保持约5%。 30%的发射率(“灰色”状态)。此外,我们的数据表明,厚壳(15-19 ML)NQD(“巨型”或g-NQD)的高度稳定,无闪烁的PL具有近乎完美的泊松统计特征,对应于狭窄的散粒噪声限制PL强度分布。有趣的是,在这种情况下,PL的寿命会随着泵浦功率的增加而缩短,并且PL的衰减可能会偏离单指数。但是,PL强度分布仍然受散粒噪声限制,这表明在实验时间窗口内,在给定的泵浦功率强度下,没有明显的量子产率波动。

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