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Does the Temperature Dependence of the Charge Carrier Mobility in Disordered Organic Semiconductors at Large Carrier Concentrations Obey the Meyer-Neldel Compensation Law?

机译:大载流子浓度下无序有机半导体中电荷载流子迁移率的温度依赖性是否符合Meyer-Neldel补偿定律?

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摘要

The temperature-activated charge transport in disordered organic semiconductors at large carrier concentrations has been thoroughly considered, by using a recent analytical model [Phys.Rev.B 76, 045210 (2007)J assuming a Gaussian density-of-states (DOS) distribution and Miller-Abrahams jump rates. We demonstrate that the apparent Meyer-Neldel compensation rule is recovered with regard for the temperature dependences of the charge carrier mobility upon varying the carrier concentration, but not for varying the DOS distribution width. We show that this phenomenon is entirely due to the evolution of the occupational DOS distribution as a function of the state filling. Predictions of the model are in a quantitative agreement with available experimental results.
机译:通过使用最新的分析模型[Phys.Rev.B 76,045210(2007)J,假设高斯态密度(DOS)分布,已经充分考虑了在高载流子浓度下无序有机半导体中的温度激活电荷传输。 Miller-Abrahams的跳高率。我们证明,在改变载流子浓度时,关于电荷载流子迁移率的温度依赖性,恢复了表观的迈耶-内德尔补偿规则,但没有改变DOS分布宽度。我们表明,这种现象完全是由于职业DOS分布随状态填充而变化的。该模型的预测与可用的实验结果在数量上一致。

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