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Experimental validation of a method for removing the capacitive leakage artifact from electrical bioimpedance spectroscopy measurements

机译:从电生物阻抗谱测量中去除电容泄漏伪影的方法的实验验证

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摘要

Often when performing electrical bioimpedance (EBI) spectroscopy measurements, the obtained EBI data present a hook-like deviation, which is most noticeable at high frequencies in the impedance plane. The deviation is due to a capacitive leakage effect caused by the presence of stray capacitances. In addition to the data deviation being remarkably noticeable at high frequencies in the phase and the reactance spectra, the measured EBI is also altered in the resistance and the modulus. If this EBI data deviation is not properly removed, it interferes with subsequent data analysis processes, especially with Cole model-based analyses. In other words, to perform any accurate analysis of the EBI spectroscopy data, the hook deviation must be properly removed. Td compensation is a method used to compensate the hook deviation present in EBI data; it consists of multiplying the obtained spectrum, Z_(meas)(omega), by a complex exponential in the form of exp(-j(omega)Td). Although the method is well known and accepted, Td compensation cannot entirely correct the hook-like deviation; moreover, it lacks solid scientific grounds. In this work, the Td compensation method is revisited, and it is shown that it should not be used to correct the effect of a capacitive leakage; furthermore, a more developed approach for correcting the hook deviation caused by the capacitive leakage is proposed. The method includes a novel correcting expression and a process for selecting the proper values of expressions that are complex and frequency dependent. The correctness of the novel method is validated with the experimental data obtained from measurements from three different EBI applications. The obtained results confirm the sufficiency and feasibility of the correcting method.
机译:通常,在执行电生物阻抗(EBI)光谱测量时,获得的EBI数据呈现出钩状偏差,该偏差在阻抗平面中的高频下最明显。该偏差是由于杂散电容的存在引起的电容性泄漏效应引起的。除了在相和电抗谱中的高频处明显注意到数据偏差外,测得的EBI的电阻和模量也发生了变化。如果未正确消除此EBI数据偏差,则它将干扰后续的数据分析过程,尤其是基于Cole模型的分析。换句话说,要对EBI光谱数据进行任何准确的分析,必须正确消除弯钩偏差。 Td补偿是一种用于补偿EBI数据中存在的挂钩偏差的方法。它包括将获得的频谱Z_(meas)ω乘以exp(-jTmega)形式的复指数。尽管该方法是众所周知的并且被接受,但是Td补偿不能完全校正钩状偏差。此外,它缺乏扎实的科学依据。在这项工作中,重新探讨了Td补偿方法,并表明不应使用它来校正电容性泄漏的影响。此外,提出了一种更先进的方法来校正由电容性泄漏引起的钩偏差。该方法包括新颖的校正表达式和用于选择复杂且取决于频率的表达式的适当值的过程。从三个不同的EBI应用程序的测量中获得的实验数据验证了该新方法的正确性。所得结果证实了校正方法的充分性和可行性。

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