A curved surface micro-moire method and its application in evaluating curved surface residual stress

摘要

The moire method is typically applied to the measurement of deformations of a flat surface while, for a curved surface, this method is rarely used other than for projection moire or moire interferometry. Here, a novel colour charge-coupled device (CCD) micro-moire method has been developed, based on which a curved surface micro-moire (CSMM) method is proposed with a colour CCD and optical microscope (OM). In the CSMM method, no additional reference grating is needed as a Bayer colour filter array (CFA) installed on the OM in front of the colour CCD image sensor performs this role. Micro-moire fringes with high contrast are directly observed with the OM through the Bayer CFA under the special condition of observing a curved specimen grating. The principle of the CSMM method based on a colour CCD micro-moire method and its application range and error analysis are all described in detail. In an experiment, the curved surface residual stress near a welded seam on a stainless steel tube was investigated using the CSMM method.