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Measurement of distance changes using a fibre-coupled common-path interferometer with mechanical path length modulation

机译:使用带有机械路径长度调制的光纤耦合共路径干涉仪测量距离变化

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摘要

We present a novel type of fibre-coupled interferometric sensor. A micro-optical probe acts as a common-path interferometer and focuses the measuring light emitted by a laser diode onto the surface under investigation. The probe is mounted on a bending beam and deflected periodically by a piezoelectric actuator. This generates a phase-modulated interference signal, which is transformed to an electrical signal by a photo diode. The measurement principle is based on the fact that a distance change between the probe and the measurement object leads to a characteristic phase-shift of the measured signal. The photo diode signal is analysed in different ways in order to enable both high accuracy in the nanometre range and high measurement speeds, where the data rate of the sensor is finally limited by the conversion rate of the used analogue-to-digital converter. In order to extend the range of unambiguity of the sensor and to improve the robustness of measurement, we apply a dual-wavelength technique using two laser diodes emitting at different wavelengths simultaneously. Repeatability measurements, responses to distance changes and, finally, the measurement of calibration specimens with well-defined surface profiles demonstrate the performance of the system.
机译:我们提出了一种新型的光纤耦合干涉传感器。微型光学探针用作共通干涉仪,将激光二极管发出的测量光聚焦到正在研究的表面上。探头安装在弯曲梁上,并由压电致动器周期性地偏转。这会产生相位调制的干扰信号,该信号会被光电二极管转换为电信号。测量原理基于这样的事实,即探头和测量对象之间的距离变化会导致被测信号的特征相移。光电二极管信号以不同的方式进行分析,以实现纳米范围内的高精度和高测量速度,其中传感器的数据速率最终受到所用模数转换器的转换速率的限制。为了扩大传感器的明确性范围并提高测量的鲁棒性,我们采用了使用两个同时发射不同波长的激光二极管的双波长技术。重复性测量,对距离变化的响应以及具有明确定义的表面轮廓的校准样品的测量证明了系统的性能。

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