Viability of an optoelectronic system for real time roughness measurement

摘要

Surface roughness evaluation is very important to characterize surface finish. Roughness parameter can be calculated in either two-dimensional (2D) or three-dimensional (3D) form. 2D profile analysis has been widely used in science and engineering for more than half century. In recent years, there was an increases need for 3D surface analysis. The aim of this paper is to present a new optoelectronic system based on two lasers diode for 3D real-time surface roughness measurement. 3D surface roughness parameter (S_q), of a surface characterized by a stationary Gaussian random process, is estimated using Spectral Speckle Correlation (SSC). In the paper, theory is described and experimental results are given.