A microwave method based on amplitude-only reflection measurements for permittivity determination of low-loss materials

摘要

A new method based on amplitude-only reflection measurements for complex permittivity determination of low-loss materials backed by a short-circuit termination is presented. There are two main advantages of the proposed method. First, it is insensitive to calibration plane shifts and phase uncertainties in reflection measurements of low-loss materials. Second, it does not require any additional test material with a thickness value different than that of the material under test. The disadvantage of the proposed method is that it is not convenient to apply for complex permittivity determination of dispersive low-loss materials. The method is validated by complex and amplitude-only scattering parameter measurements at X-band of a low-loss sample (polystyrene) fitted into a waveguide section. The method, as other non-resonant methods, can only provide a rough indication of the imaginary part of the permittivity for low-loss samples.